| ASSIST Document Search for DOD and Federal Specs |
|
| Number | Revision | Date | Title |
| MIL-B-5087 |
B |
10/64 |
Bonding for Aerospace Systems |
| MIL-HDBK-5 |
J |
01/03 |
Metallic Materials and Elements (70MB) |
| MIL-HDBK-17 |
Composite Materials Handbook |
||
|
Volume 1 |
F |
06/02 |
Polymer Matrix/Guidelines for
Characterization |
|
Volume 2 |
F |
06/02 |
Polymer Matrix/Materials
Propoerties |
|
Volume 3 |
F |
06/02 |
Polymer Matrix/Materials Usage,
Design and Analysis |
|
Volume 4 |
A |
06/02 |
Metal Matrix Composites |
|
Volume 5 |
- |
06/02 |
Ceramic Matrix Composites |
| MIL-HDBK-217 |
F Notice 2 |
02/95 |
Reliability Prediction of Electronic Equipment |
| MIL-HDBK-340 |
Notice 1 |
10/94 |
Application Guidelines for
MIL-STD-1540 |
| MIL-HDBK-343 |
- |
02/86 |
Design, Construction, and Test
Requirements for One-of-a-Kind Spacecraft |
| MIL-M-38510 |
J |
11/91 |
Military Specification,
Microcircuits |
| MIL-PRF-13830 | B | 01/97 |
Optical Component Inspection |
| MIL-PRF-19500 |
M |
10/99 |
Performance Specification,
Semiconductor Devices |
| QML-19500 |
22 |
05/04 |
Qualified Manufacturers List |
| MIL-PRF-31032 |
- |
11/95 |
Printed Circuit Board, General
Spec. |
| MIL-PRF-38534 |
E |
01/03 |
Performance Specification,
Hybrid Circuits |
| QML-38534 |
48 |
03/04 |
Qualified Manufacturers List |
| MIL-PRF-38535 |
F |
12/02 |
Performance Specification,
Integrated Circuits |
| QML-38535 |
17 |
07/03 |
Qualified Manufacturers List |
| MIL-STD-202 |
G |
02/02 |
Test Method Standad, Electronic
Parts |
MIL-STD-461 |
C |
08/86 |
Control of Electromagnetic Interference |
| E |
08/99 |
Control of Electromagnetic
Interference |
|
| Draft |
06/99 |
461E Draft in MSWord Format |
|
| XREF |
03/01 |
Comparison of 461E with other
standards |
|
| MIL-STD-462 |
- | 10/87 | Measurement of Electromagnetic Interference Characteristics (incl. Notice 6) |
MIL-STD-750 |
D |
02/95 |
Test Method, Semiconductor Devices |
| Notice 1 |
05/95 |
||
| Notice 2 |
02/96 |
||
| Notice 3 |
02/00 |
||
| Notice 4 |
04/01 |
||
| Notice 5 |
11/02 |
||
| MIL-STD-810 |
F |
08/02 |
Test Method Standard/Env. Eng. Tests |
MIL-STD-883 |
E |
12/96 |
Test Method Standard/Microcircuits |
| Notice 1 |
12/97 |
||
| Notice 2 |
08/98 |
||
| Notice 3 |
11/99 |
||
| Notice 4 |
12/00 |
||
| Notice 5 |
03/03 |
||
| MIL-STD-1246 |
C | 04/94 |
Cleanliness Levels |
| Notice 1 |
05/94 |
||
| Notice 2 |
12/94 |
||
| Notice 3 |
06/98 |
||
| Notice 4 |
02/02 |
||
| MIL-STD-1540 |
E-Draft |
12/02 |
Test Requirements for Launch
& Space Vehicles (restricted access) |
| MIL-STD-1553 |
B |
09/76 |
Multiplex
Data Bus |
| Notice 1 |
02/80 |
||
| Notice 2 |
09/86 |
||
| Notice 3 |
01/93 |
||
| Notice 4 |
01/96 |